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4月15日——16日， 2018年第十二届中国科学仪器发展年会(ACCSI 2018)在常州召开。作为年会的“重头戏”，ACCSI 2018“仪器及检测风云榜颁奖盛典”依然备受瞩目。千余业内精英齐聚典礼现场，共同见证了科学仪器行业各项“重量级”奖项的诞生。天瑞仪器应邀出席，并摘得“2017科学仪器行业最具影响力厂商”及“2017科学仪器行业最受关注仪器”2项大奖。
“最具影响力厂商”由仪器信息网发起的“2017年度科学仪器行业最具影响力厂商”评选活动筛选产生。该活动是从仪器信息网的千余家参展商中，根据厂商2017年度的中国产值、在仪器信息网的年度独立访问人数、在用户中的关注度等作为主要评选维度，经过综合评分计算，最终确定天瑞仪器入围。该奖项的获得，是对天瑞仪器2017年整体成绩的肯定，也是对天瑞仪器继续前行继续奋斗的激励。
“科学仪器行业最受关注仪器奖”自评选以来，已成功举行过10届，作为仪器信息网重要产品奖项之一，该奖项评选旨在表彰当年度受用户关注最高的仪器。本次评选涉及20个仪器类别，共计吸引了150余家公司200余台仪器参与其中。天瑞仪器Genius XRF手持式X荧光分析仪突破重围，成功当选。
近年来，天瑞在Genius XRF 基础上，结合10多年便携XRF技术研发经验，集中了光电子、微电子、半导体和计算机等多项技术，具有自主知识产权的全新一代手持XRF产品——Explorer XRF系列。可广泛应用于有害元素分析（EXPLORER 3000）、合金分析（EXPLORER 5000）、矿石成分分析（EXPLORER 7000）以及土壤重金属分析（EXPLORER 9000）等众多领域的快速便捷检验。
Skyray Analytical Testing Instrument Research Institute has three centers, namely "analysis instrument research and development center", "physiochemical analysis and testing center" and "analysis and testing technology application development center."Tianrui Analytical Instruments Co., Ltd. recently formed a staff of 1 academician, 11 Ph.D., 13 senior engineers, 17 masters, and 50 undergraduate R&D personnel from famous universities.
Mr. Liu Zhaogui: graduate student in nuclear physics from Tsinghua University. It has been appraised as the outstanding entrepreneur of Jiangsu Province, the young and middle-aged experts who have outstanding contribution in Jiangsu Province, the first science and Technology Minister of Kunshan, and the national science and technology ministry "scientific and technological innovation and entrepreneurial talent". With the approval of the State Council, the special allowance of the State Council is enjoyed.
Dr. Yao graduated from the Department of Engineering Physics of Tsinghua University with a Ph.D. in nuclear electronics. He has been engaged in the development of analytical instruments for 26 years. He is mainly engaged in the research of X-ray fluorescence analysis technology and application technology, and he participated in the "Thirteenth Five-Year Plan" national key instrument technology research and development. Patent of "Spectrometer Grating 2D" patent, "X-ray fluorescence double crystal fixed element track spectrometer" patent and "X-ray fluorescence spectrum analyzer pyrolytic graphite crystal beam splitter" patent, and participated in the drafting of a number of national standards industry The standard is an authoritative expert in the X-ray fluorescence spectrometer industry in China.
The FP (Basic Parameters) algorithm is an effective method for X-ray fluorescence spectrometry analysis. It can perform qualitative and quantitative analysis of the elemental components of the sample with little or no standard sample, and can also analyze the thickness of the coating or coating.It is well known that the biggest problem with X-ray fluorescence analysis is that elemental fluorescence intensity is affected by coexisting elements (matrix absorption and enhancement effects) and is not usually linear with content. The basic parameter method has already taken into account the matrix effect in the calculation of the spectrum, and the linear relationship between the calculated content and the known content can be obtained. Using a few known sample calibration algorithms to eliminate systematic errors can achieve accurate quantitative results.
The polarization secondary target excitation technology can remove the scattering background to the maximum extent, improve the signal to noise ratio, and reduce the detection limit of the detector. Assuming that the x-ray generated by the anode of the x-ray tube is non-polarized and is incident on the target (scattering body) in the z-axis direction, the scattered beam propagating along the y-axis is linearly polarized light. The electric field vector vibrates in the v plane and the vibration direction is parallel to the X axis. The sample placed on the y-axis is excited by polarized light, producing unpolarized fluorescent x-rays. Since the sample and the sample support do not generate scattered radiation in the X-axis direction, placing the detector on the x-axis can fully utilize the polarization effect and reduce the background caused by the elastic and inelastic scattering of x-rays.
From the X-ray generator to the sample, the X-ray fluorescence emitted by the sample to the detector is called the light path. The shorter the distance traveled by the optical path is, the less interference will be caused. Skyray Instrument designed an ultra-short optical path technology to ensure the accuracy of light element detection results, and is particularly suitable for RoHS-compliant halogen-free instruction detection.
The micro-level positioning, micro-scanning analysis, the point-to-point centering of the spatial micro-sized spot and the determination of the spatial micro-focus spot position have been truly achieved. A translation and rotation switching position device realizes position rotation switching in a small space, avoids the large space required for the linear motion and the common rotation movement, because the problem of lengthening of the optical path caused by the inability to fit is eliminated.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
Skyray's unique SNR enhancement technology can effectively remove noise signal interference and minimize element detection limits.
As shown in Figure SUPER XRF 1050, the determination of Pb in food can be as low as 0.59 ppm.
patented intelligent analysis software enables precise analysis of 80 elements, non-standard quantitative analysis, micro-analysis, thin film analysis, and advanced sub-spectral analysis.
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