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江苏天瑞仪器股份有限公司生产光谱、色谱、质谱等分析测试仪器及其软件的研发、生产和销售的一体型企业。公司于2011年1月25日在深圳创业板上市,成为分析测试仪器行业的一家上市公司。天瑞仪器是具有RoHS环保测试仪|RoHS2.0检测仪|邻苯测试仪|XRF|卤素仪|重金属测试仪|XRF|金属镀层测厚仪|金镍厚测试仪|金属元素分析仪|便携式测试仪|天瑞EDX1800B|天瑞镀层膜厚仪|天瑞EDX1800E|天瑞rohs测试天瑞ROHS有害元素分析仪|ROHS无卤元素分析仪|气相色谱|相色谱|子吸收光谱|X射线荧光光谱仪|光电直读光谱仪|ICP光谱仪|金属多元素分析仪|碳硫分析仪|X荧光测厚仪ROHS仪器、无卤分析仪、REACH分析仪、增塑剂检测仪等仪器的生产销售,
汽车ELV检测仪移动样品平台
电制冷Si-PIN探测器
信号检测电子电路
高低压电源
大功率X光管
计算机及喷墨打印机
汽车ELV检测仪产品特点
快速:一般测量一个样品只需要1~3分钟
无损:物理测量,不改变样品性质
直观:直观的分析谱图,元素分布一幕了然
环保:检测过程中不产生任何废气、废水
汽车ELV检测仪是一款集卤素指令、RoHS指令、重金属指令于一体的X荧光光谱仪。对铅、汞、镉、钡等元素有很好的检测下限以及精度。X荧光光谱仪根据各元素的特征X射线的强度,可以测定元素含量。近年来,X荧光光谱分析在各行业应用范围不断拓展,已成为一种广泛应用于冶金、地质、有色、建材、商检、环保、卫生等各个域,特别是在RoHS检测域应用得多也广泛。大多数分析元素均可用其进行分析,可分析固体、粉末、熔珠、液体等样品,分析范围为Be到U。并且具有分析速度快、测量范围宽、干扰小的特点。
针对EDX1800ROHS含铅量检测仪在各个域的广泛应用,根据优化产品性能和提高安全防护等的需求,特别设计该款EDX1800B。应用新一代的高压电源和X光管,提高产品的可靠性;利用新X光管的大功率提高仪器的测试效率。
ROHS含铅量检测仪移动样品平台
电制冷Si-PIN探测器
信号检测电子电路
高低压电源
大功率X光管
计算机及喷墨打印机
ROHS含铅量检测仪元素分析范围从硫(S)到铀(U)
分析检出限可达1ppm
分析含量一般为1ppm到99.99%
任意多个可选择的分析和识别模型
相互立的基体效应校正模型
多变量非线性回归程序
温度适应范围为15℃至30℃
电源:交流220V±5V,建议配置交流净化稳压电源
能量分辨率:160±5eV
外观尺寸: 550×416×333mm
样品腔尺寸:460×298×98mm
重量:45Kg
Skyray Analytical Testing Instrument Research Institute has three centers, namely "analysis instrument research and development center", "physiochemical analysis and testing center" and "analysis and testing technology application development center."Tianrui Analytical Instruments Co., Ltd. recently formed a staff of 1 academician, 11 Ph.D., 13 senior engineers, 17 masters, and 50 undergraduate R&D personnel from famous universities.
Mr. Liu Zhaogui: graduate student in nuclear physics from Tsinghua University. It has been appraised as the outstanding entrepreneur of Jiangsu Province, the young and middle-aged experts who have outstanding contribution in Jiangsu Province, the first science and Technology Minister of Kunshan, and the national science and technology ministry "scientific and technological innovation and entrepreneurial talent". With the approval of the State Council, the special allowance of the State Council is enjoyed.
Dr. Yao graduated from the Department of Engineering Physics of Tsinghua University with a Ph.D. in nuclear electronics. He has been engaged in the development of analytical instruments for 26 years. He is mainly engaged in the research of X-ray fluorescence analysis technology and application technology, and he participated in the "Thirteenth Five-Year Plan" national key instrument technology research and development. Patent of "Spectrometer Grating 2D" patent, "X-ray fluorescence double crystal fixed element track spectrometer" patent and "X-ray fluorescence spectrum analyzer pyrolytic graphite crystal beam splitter" patent, and participated in the drafting of a number of national standards industry The standard is an authoritative expert in the X-ray fluorescence spectrometer industry in China.
The FP (Basic Parameters) algorithm is an effective method for X-ray fluorescence spectrometry analysis. It can perform qualitative and quantitative analysis of the elemental components of the sample with little or no standard sample, and can also analyze the thickness of the coating or coating.It is well known that the biggest problem with X-ray fluorescence analysis is that elemental fluorescence intensity is affected by coexisting elements (matrix absorption and enhancement effects) and is not usually linear with content. The basic parameter method has already taken into account the matrix effect in the calculation of the spectrum, and the linear relationship between the calculated content and the known content can be obtained. Using a few known sample calibration algorithms to eliminate systematic errors can achieve accurate quantitative results.
The polarization secondary target excitation technology can remove the scattering background to the maximum extent, improve the signal to noise ratio, and reduce the detection limit of the detector. Assuming that the x-ray generated by the anode of the x-ray tube is non-polarized and is incident on the target (scattering body) in the z-axis direction, the scattered beam propagating along the y-axis is linearly polarized light. The electric field vector vibrates in the v plane and the vibration direction is parallel to the X axis. The sample placed on the y-axis is excited by polarized light, producing unpolarized fluorescent x-rays. Since the sample and the sample support do not generate scattered radiation in the X-axis direction, placing the detector on the x-axis can fully utilize the polarization effect and reduce the background caused by the elastic and inelastic scattering of x-rays.
From the X-ray generator to the sample, the X-ray fluorescence emitted by the sample to the detector is called the light path. The shorter the distance traveled by the optical path is, the less interference will be caused. Skyray Instrument designed an ultra-short optical path technology to ensure the accuracy of light element detection results, and is particularly suitable for RoHS-compliant halogen-free instruction detection.
The micro-level positioning, micro-scanning analysis, the point-to-point centering of the spatial micro-sized spot and the determination of the spatial micro-focus spot position have been truly achieved. A translation and rotation switching position device realizes position rotation switching in a small space, avoids the large space required for the linear motion and the common rotation movement, because the problem of lengthening of the optical path caused by the inability to fit is eliminated.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
Skyray's unique SNR enhancement technology can effectively remove noise signal interference and minimize element detection limits.
As shown in Figure SUPER XRF 1050, the determination of Pb in food can be as low as 0.59 ppm.
patented intelligent analysis software enables precise analysis of 80 elements, non-standard quantitative analysis, micro-analysis, thin film analysis, and advanced sub-spectral analysis.
hotline:800-9993-818
TEL:86 136 1622 3382
Address: 1888 Zhonghuayuan West Road, Kunshan City, Jiangsu Province/
深圳宝安区松岗芙蓉东路桃花源科技创新园22层