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为认真贯彻落实党的十九大精神,增强全面法治观念,推动全社会树立宪法意识,扎实做好国家宪法日宣传活动,12月18日,天瑞仪器组织开展以“学习贯彻党的十九大精神,维护宪法权威”为主题的相关会议。天瑞仪器中层管理人员及党支部全体成员出席会议。
会议现场
会议由天瑞仪器副总经理肖廷良主持。总经理应刚先生作开场致辞,他畅谈了学习贯彻十九大精神、维护宪法权威对我们开展工作的重要意义。
应总经理致辞
天瑞仪器法务部吴承华部长作了题为《依法治国——新时代法治的进步体现》的主题报告,他畅谈我国宪法的发展历程,提纲挈领地指出国家宪法日的重要意义以及法治宣传教育的重要性。
天瑞仪器吴承华部长作报告
天瑞仪器党支部书记束长干以十九大精神为主要内容,总结了习近平总书记在十九大报告中关于依法治国的重要论述与关键内容,要求与会人员深刻领会和准确把握党的十九大精神。
天瑞仪器党支部书记束长干发言
通过本次会议,增强了天瑞管理人员与党支部成员的法治观念,使大家进一步了解国家宪法的历史,开拓视野;同时也增强了党员之间的密切联系,有利于进一步促进天瑞仪器党组织的建设。
Skyray Analytical Testing Instrument Research Institute has three centers, namely "analysis instrument research and development center", "physiochemical analysis and testing center" and "analysis and testing technology application development center."Tianrui Analytical Instruments Co., Ltd. recently formed a staff of 1 academician, 11 Ph.D., 13 senior engineers, 17 masters, and 50 undergraduate R&D personnel from famous universities.
Mr. Liu Zhaogui: graduate student in nuclear physics from Tsinghua University. It has been appraised as the outstanding entrepreneur of Jiangsu Province, the young and middle-aged experts who have outstanding contribution in Jiangsu Province, the first science and Technology Minister of Kunshan, and the national science and technology ministry "scientific and technological innovation and entrepreneurial talent". With the approval of the State Council, the special allowance of the State Council is enjoyed.
Dr. Yao graduated from the Department of Engineering Physics of Tsinghua University with a Ph.D. in nuclear electronics. He has been engaged in the development of analytical instruments for 26 years. He is mainly engaged in the research of X-ray fluorescence analysis technology and application technology, and he participated in the "Thirteenth Five-Year Plan" national key instrument technology research and development. Patent of "Spectrometer Grating 2D" patent, "X-ray fluorescence double crystal fixed element track spectrometer" patent and "X-ray fluorescence spectrum analyzer pyrolytic graphite crystal beam splitter" patent, and participated in the drafting of a number of national standards industry The standard is an authoritative expert in the X-ray fluorescence spectrometer industry in China.
The FP (Basic Parameters) algorithm is an effective method for X-ray fluorescence spectrometry analysis. It can perform qualitative and quantitative analysis of the elemental components of the sample with little or no standard sample, and can also analyze the thickness of the coating or coating.It is well known that the biggest problem with X-ray fluorescence analysis is that elemental fluorescence intensity is affected by coexisting elements (matrix absorption and enhancement effects) and is not usually linear with content. The basic parameter method has already taken into account the matrix effect in the calculation of the spectrum, and the linear relationship between the calculated content and the known content can be obtained. Using a few known sample calibration algorithms to eliminate systematic errors can achieve accurate quantitative results.
The polarization secondary target excitation technology can remove the scattering background to the maximum extent, improve the signal to noise ratio, and reduce the detection limit of the detector. Assuming that the x-ray generated by the anode of the x-ray tube is non-polarized and is incident on the target (scattering body) in the z-axis direction, the scattered beam propagating along the y-axis is linearly polarized light. The electric field vector vibrates in the v plane and the vibration direction is parallel to the X axis. The sample placed on the y-axis is excited by polarized light, producing unpolarized fluorescent x-rays. Since the sample and the sample support do not generate scattered radiation in the X-axis direction, placing the detector on the x-axis can fully utilize the polarization effect and reduce the background caused by the elastic and inelastic scattering of x-rays.
From the X-ray generator to the sample, the X-ray fluorescence emitted by the sample to the detector is called the light path. The shorter the distance traveled by the optical path is, the less interference will be caused. Skyray Instrument designed an ultra-short optical path technology to ensure the accuracy of light element detection results, and is particularly suitable for RoHS-compliant halogen-free instruction detection.
The micro-level positioning, micro-scanning analysis, the point-to-point centering of the spatial micro-sized spot and the determination of the spatial micro-focus spot position have been truly achieved. A translation and rotation switching position device realizes position rotation switching in a small space, avoids the large space required for the linear motion and the common rotation movement, because the problem of lengthening of the optical path caused by the inability to fit is eliminated.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
Skyray's unique SNR enhancement technology can effectively remove noise signal interference and minimize element detection limits.
As shown in Figure SUPER XRF 1050, the determination of Pb in food can be as low as 0.59 ppm.
patented intelligent analysis software enables precise analysis of 80 elements, non-standard quantitative analysis, micro-analysis, thin film analysis, and advanced sub-spectral analysis.
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